The point spectral system is a non-contact single-point 3D measuring module integrated into COBEKK vision measuring machines. Conventional optical cameras only capture 2D images; transparent or highly reflective workpieces often create ghost images, making micron-level height measurement impossible.
Based on spectral interference principle, the point spectral sensor captures nano-scale height data for single points, resisting interference from reflective and transparent materials. It overcomes the weakness of standard optical vision when measuring tiny heights on glossy or transparent parts.
Typical Products & Applications: Semiconductor chips, glass, thin films, wafers, micro bumps or dents on PCB circuits, for micro step height, film thickness and micro particle height inspection.
