INDUSTRY SOLUTIONS

INDUSTRY SOLUTIONS

Wafer Measurement Scheme
Customer Demand
Measure the diameter, thickness, warpage (WARP) and bending (BOW) of the wafer.
Measuring Result
Measuring Result
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Repeated test results
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Test Conclusion
COBEKK recommends the AF series of image measurement instruments, combined with the i-Sobit software, and equipped with Precitec 4mm spectral confocal laser.